ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California

ASM International, 2005 - Science - 523 pages

Title	ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California Volume 1 of ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California
Author	ASM International
Contributor	Electronic Device Failure Analysis Society
Edition	illustrated
Publisher	ASM International, 2005
ISBN	087170823X, 9780871708236
Length	523 pages
Subjects	Technology & Engineering › Materials Science › General Science / General Technology & Engineering / Materials Science / General

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