Advances in X-Ray Analysis: Volume 38D.K. Bowen, John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Paul K. Predecki, Deane K. Smith The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up. |
Contents
DYNAMIC CHARACTERIZATION IN ADVANCED MANUFACTURING | 1 |
NONINVASIVE TEMPERATURE MEASUREMENTS BY NEUTRON | 9 |
SYSTEM AND APPLICATIONS | 21 |
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Advances in X-Ray alloy analytical angle annealing applied atomic background beam blood lead bone lead Bragg angle Bragg peak calculated calibration CBLI coefficients composition Compton scattering correction Cryst crystal crystalline detection detector determined diffraction patterns diffraction peaks diffractometer effects electron elements energy equation error experimental film function FWHM incident instrument intensity interface lattice parameter layer material matrix measurements metal method monitor monochromator neutron neutron diffraction NIST obtained orientation phase photon Phys pixel plane Plenum Press polymer powder diffraction Predecki pyroaurite quantitative radiation range ratio reciprocal lattice reciprocal space reciprocal space map reflection relaxation residual stress resolution rhodium Rietveld refinement rocking curve sample scan scattering shown in Figure shows silicon simulation slit smectite specimen spectrum standard strain structure substrate surface Table technique temperature thermal thickness tube values vivo width X-Ray Analysis x-ray diffraction x-ray fluorescence z-profile