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J B Cohen 1 Department of Materials Science and Engineering
Principles of XRay Stress Measurement
Control of Accuracy and Precision
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absorption acceptor alloy angle Appl bandgap beam behavior binding energies Bragg angle Bragg's law broadening Cavenett Cohen components composition profile cooling crystal curve Dahlgren defects deformation deposits depth detector determined diffractometer diffusion coefficients dislocation donor dye laser effect elastic electron emission excess carrier excitation exciton experimental factor film GaAs gradient grain Hauk heat Houska hyperfine field implantation impurities intensity bands interaction iron atoms isomer shift lattice parameter layer Lett luminescence Macherauch magnetic Materials Science Metals method Monemar Mossbauer spectroscopy neighbor observed obtained optical cross sections phase photoluminescence photon Phys PL spectra plane powder rays recombination region residual stress ribbon sample semiconductors shot peening sin2 slit Society of Materials solid Solid State Electron specimen spectrum sputter deposition sputtering steel stress measurements structure studies subgrain substrate surface target technique temperature thermal thickness tilt variation velocity X-Ray Anal x-ray diffraction