Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1

Front Cover
Herbert Herman
Academic Press, 1972 - Chemistry, Physical and theoretical - 256 pages

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Contents

The Measurement of Residual Stresses by XRay Diffraction Techniques
1
R James and J B Cohen I Introduction II Types of Residual Stresses
2
Principles of XRay Stress Measurement
4
Copyright

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