Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 82
B . Computer Simulation of Intensity Sub - Bands If it assumed that the
composition profile is known , an intensity band can be readily computed using
Eq . ( 19 ) . The stepped intensity band illustrated in Fig . 6 is an example of the
direct ...
B . Computer Simulation of Intensity Sub - Bands If it assumed that the
composition profile is known , an intensity band can be readily computed using
Eq . ( 19 ) . The stepped intensity band illustrated in Fig . 6 is an example of the
direct ...
Page 87
Cu - Ni system , one finds about 22 IH in the full band extending from pure Ni to
Cu , and yet the intensity is still reasonably concentrated above the background
level . In the case of Cu - Pd , which has also been studied by X - ray diffraction ...
Cu - Ni system , one finds about 22 IH in the full band extending from pure Ni to
Cu , and yet the intensity is still reasonably concentrated above the background
level . In the case of Cu - Pd , which has also been studied by X - ray diffraction ...
Page 89
One can estimate the importance of this contribution to the intensity band by
using existing corrections over the full 20 range of a band . When the correction is
nearly constant over the full band or changes by less than about 10 % , it
probably ...
One can estimate the importance of this contribution to the intensity band by
using existing corrections over the full 20 range of a band . When the correction is
nearly constant over the full band or changes by less than about 10 % , it
probably ...
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray