Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 42
This produces a nonrandom distribution in the interplanar spacing , which is
related to any texture developed during the plastic deformation process . Marion
and Cohen ( 1974 ) developed a distribution function f ( y ) describing the
variation in ...
This produces a nonrandom distribution in the interplanar spacing , which is
related to any texture developed during the plastic deformation process . Marion
and Cohen ( 1974 ) developed a distribution function f ( y ) describing the
variation in ...
Page 43
( But there is no agreement between the stresses determined by this method and
that from the " texture independent ” \ tilts that were discussed above , based on
elastic anisotropy and the Ruess assumption . ) The distribution function
describes ...
( But there is no agreement between the stresses determined by this method and
that from the " texture independent ” \ tilts that were discussed above , based on
elastic anisotropy and the Ruess assumption . ) The distribution function
describes ...
Page 85
9 is a schematic drawing illustrating such a pileup when the broadening function
becomes zero . The endpoints are 8 functions with appropriate integral values .
The solid curve neglects sample absorption , while the dashed includes this
effect ...
9 is a schematic drawing illustrating such a pileup when the broadening function
becomes zero . The endpoints are 8 functions with appropriate integral values .
The solid curve neglects sample absorption , while the dashed includes this
effect ...
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray