Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 79
Intensity band , consisting of summation of integrated intensities for all
measurable sections m ( stepped curve ) , individual specimen broadening
functions ( dashed ) , instrumental broadening function ( upper center ) , and
broadened ...
Intensity band , consisting of summation of integrated intensities for all
measurable sections m ( stepped curve ) , individual specimen broadening
functions ( dashed ) , instrumental broadening function ( upper center ) , and
broadened ...
Page 88
The overlapping TDS from each element m leads to an increase in the band
intensity ( Delhez and Mittemeijer , 1978 ) . This can be missed in diffraction
patterns unless the intensity scale is greatly reduced , allowing the peaks to run
off scale .
The overlapping TDS from each element m leads to an increase in the band
intensity ( Delhez and Mittemeijer , 1978 ) . This can be missed in diffraction
patterns unless the intensity scale is greatly reduced , allowing the peaks to run
off scale .
Page 89
intensity is spread over a large 20 range ( see Cu - Au in Table II ) , a larger
fraction of TDS will be included . One can estimate the importance of this
contribution to the intensity band by using existing corrections over the full 20
range of a band ...
intensity is spread over a large 20 range ( see Cu - Au in Table II ) , a larger
fraction of TDS will be included . One can estimate the importance of this
contribution to the intensity band by using existing corrections over the full 20
range of a band ...
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray