Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 20
Both use counting statistics to determine the statistical error in a stress
measurement . Greater ... measurements are required , such as in studies of
fatigue ( Quesnel et al . , 1978 ) when many samples or test conditions must be
examined .
Both use counting statistics to determine the statistical error in a stress
measurement . Greater ... measurements are required , such as in studies of
fatigue ( Quesnel et al . , 1978 ) when many samples or test conditions must be
examined .
Page 33
METHODS OF LOCATION OF THE DIFFRACTION PEAK The centroid of a
diffraction peak has been used in x - ray stress measurements ( Ladell et al . ,
1959 ; Pike and Wilson , 1959 ; Singh and Balasingh , 1971 ; Baucum and
Ammons ...
METHODS OF LOCATION OF THE DIFFRACTION PEAK The centroid of a
diffraction peak has been used in x - ray stress measurements ( Ladell et al . ,
1959 ; Pike and Wilson , 1959 ; Singh and Balasingh , 1971 ; Baucum and
Ammons ...
Page 182
This is in contrast to various measuring techniques based on thermal excitation of
carriers , where entropy terms have to be ... and capture cross sections ) are
therefore based on junction measurements , such as photocapacitance ( Sah et
al .
This is in contrast to various measuring techniques based on thermal excitation of
carriers , where entropy terms have to be ... and capture cross sections ) are
therefore based on junction measurements , such as photocapacitance ( Sah et
al .
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray