Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 174
It has recently been employed for profiling of very thin multilayer structures grown
by molecular beam epitaxy ( MBE ) ( Ludeke et al . , 1974 ) . The method of
secondary ion mass spectroscopy ( SIMS ) has also recently been developed as
a ...
It has recently been employed for profiling of very thin multilayer structures grown
by molecular beam epitaxy ( MBE ) ( Ludeke et al . , 1974 ) . The method of
secondary ion mass spectroscopy ( SIMS ) has also recently been developed as
a ...
Page 176
So , e . g . , has only recently a reevaluation of the bandgap of GaP become
necessary , whereupon the previously established value for Ex has become
roughly doubled ( Berndt et al . , 1975 ; Monemar and Samuelson , 1978b ;
Sturge et al .
So , e . g . , has only recently a reevaluation of the bandgap of GaP become
necessary , whereupon the previously established value for Ex has become
roughly doubled ( Berndt et al . , 1975 ; Monemar and Samuelson , 1978b ;
Sturge et al .
Page 180
Very recently similar results from dye laser induced DA - pair excitation spectra
have been reported for II - VI compounds , notably ZnTe ( Dean et al . , 1978 )
and CdTe ( Legros et al . , 1978 ) . In these cases excited states and binding ...
Very recently similar results from dye laser induced DA - pair excitation spectra
have been reported for II - VI compounds , notably ZnTe ( Dean et al . , 1978 )
and CdTe ( Legros et al . , 1978 ) . In these cases excited states and binding ...
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray