Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 9
SINGLE - EXPOSURE ” METHOD A stress component may be measured from a
single inclination if the Bragg angle is determined at two positions on the
diffraction cone from a polycrystalline specimen . Figure 3 depicts the geometry in
which ...
SINGLE - EXPOSURE ” METHOD A stress component may be measured from a
single inclination if the Bragg angle is determined at two positions on the
diffraction cone from a polycrystalline specimen . Figure 3 depicts the geometry in
which ...
Page 16
The angle is obtained by rotating the specimen on the goniometer axis
independently of the counter . As seen in Fig . 6 this produces a new focal point .
In actuality , the focus is not perfect because the specimen is generally flat rather
than ...
The angle is obtained by rotating the specimen on the goniometer axis
independently of the counter . As seen in Fig . 6 this produces a new focal point .
In actuality , the focus is not perfect because the specimen is generally flat rather
than ...
Page 26
TABLE II FACTORS WHICH INFLUENCE ACCURACY AND PRECISION IN X -
RAY STRESS MEASUREMENT Instrumental and equipment Alignment of
diffractometer Specimen alignment 0 / 20 Relationship Parafocusing capability ...
TABLE II FACTORS WHICH INFLUENCE ACCURACY AND PRECISION IN X -
RAY STRESS MEASUREMENT Instrumental and equipment Alignment of
diffractometer Specimen alignment 0 / 20 Relationship Parafocusing capability ...
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray