## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

Results 1-3 of 48

Page 8

then or = m ' Pode = o [ ( 1 + v ) / E ] ( 5b ) Because several

determined , errors resulting from random fluctuations are minimized . Four to six

y tilts , taken in equal increments of sin ? y , are normally employed . 2 . " Two -

TilT ...

then or = m ' Pode = o [ ( 1 + v ) / E ] ( 5b ) Because several

**values**of door aredetermined , errors resulting from random fluctuations are minimized . Four to six

y tilts , taken in equal increments of sin ? y , are normally employed . 2 . " Two -

TilT ...

Page 13

The analysis is based on strains ( eu ) and primes imply

coordinates , whereas unprimed quantities refer to the specimen axes . For

example , €33 is the strain normal to the diffracting planes €33 ( 4 , 4 ) = 4 , 40 = €

33 [ € 11 ...

The analysis is based on strains ( eu ) and primes imply

**values**in laboratorycoordinates , whereas unprimed quantities refer to the specimen axes . For

example , €33 is the strain normal to the diffracting planes €33 ( 4 , 4 ) = 4 , 40 = €

33 [ € 11 ...

Page 85

The endpoints are 8 functions with appropriate integral

neglects sample absorption ... A single g

of the original specimen interface . If g were to take on different

The endpoints are 8 functions with appropriate integral

**values**. The solid curveneglects sample absorption ... A single g

**value**has been assumed for both sidesof the original specimen interface . If g were to take on different

**values**on each ...### What people are saying - Write a review

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### Contents

Principles of XRay Stress Measurement | 4 |

Control of Accuracy and Precision | 25 |

Applications | 45 |

Copyright | |

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray