Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 89
Thus far , no attempt has been made to convey to the reader the sensitivity of
intensity bands to a variation in the ... Small variations in composition profile
which provide large variations in slope would be expected to give large shape
changes ...
Thus far , no attempt has been made to convey to the reader the sensitivity of
intensity bands to a variation in the ... Small variations in composition profile
which provide large variations in slope would be expected to give large shape
changes ...
Page 101
X . Summary General equations were developed for nondestructive studies of
composition variations using X - ray diffraction with a reflection geometry . The
planar specimens typically found in the deposition of films on substrates provide
...
X . Summary General equations were developed for nondestructive studies of
composition variations using X - ray diffraction with a reflection geometry . The
planar specimens typically found in the deposition of films on substrates provide
...
Page 219
Moreover , the percentage of composition variation Va ' is related to the thickness
profile variation by VA : = ( 1 – CA ) 2t ' , ( 1 ) where t ' is the percentage of
thickness variation and CA the average concentration of element A in the alloy ...
Moreover , the percentage of composition variation Va ' is related to the thickness
profile variation by VA : = ( 1 – CA ) 2t ' , ( 1 ) where t ' is the percentage of
thickness variation and CA the average concentration of element A in the alloy ...
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Contents
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Applications | 45 |
Copyright | |
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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening cause coefficients components composition concentration constant cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important impurities increasing intensity iron laser lattice layer less magnetic material measurements Metals method Mössbauer needed neighbor observed obtained occur optical peak phase photoluminescence Phys plane position possible powder problem produce properties range rays recently recombination region relative residual stress sample semiconductors shift shown Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation X-ray