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Principles of XRay Stress Measurement
Control of Accuracy and Precision
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absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile constant containing cooling cross section crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel strain structure studies substrate surface target technique temperature term thickness values variation volume x-ray