## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Page 24

... the energy shift of one peak can be determined . To determine a typical

magnitude of this shift , the stress in the two - tilt method can be expressed as

follows . From Eq . ( 6 ) E i de , – do 1 + v sino 4 do Oc = ( 19 )

( 18 ) , E ...

... the energy shift of one peak can be determined . To determine a typical

magnitude of this shift , the stress in the two - tilt method can be expressed as

follows . From Eq . ( 6 ) E i de , – do 1 + v sino 4 do Oc = ( 19 )

**Substituting**in Eq .( 18 ) , E ...

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### Contents

R JAMES | 2 |

Principles of XRay Stress Measurement | 4 |

Control of Accuracy and Precision | 25 |

Copyright | |

15 other sections not shown

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absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray