## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

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Page 68

The maximum absorption path length 1-2-5 depends on the

The maximum absorption path length 1-2-5 depends on the

**average**linear absorption coefficient as well as on Om . A sampling plane of area Ae , parallel to the surface , may be imagined at various distances within the region ...Page 72

1 , sample absorption reduces the intensity by a factor n exp ( - 2u ( Y ) ) Y / sin e ] , ( 5 ) where ( u ( Y ) ) is the

1 , sample absorption reduces the intensity by a factor n exp ( - 2u ( Y ) ) Y / sin e ] , ( 5 ) where ( u ( Y ) ) is the

**average**linear absorption coefficient for all material between the free surface and a plane at a depth Y. The ...Page 129

Temperature variation of the

Temperature variation of the

**average**hyperfine field ( H h ) at 57Fe nuclei in NizFe . The inset shows the transition region in more detail . The Curie point ( 940 K ) of the disordered phase is denoted by ( + ) and the variation of the ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray