Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
From inside the book
Results 1-3 of 43
Page 8
The measured strains which correspond to one particular crystallographic
direction cannot be accurately related to stress by mechanically measured values
of the bulk elastic constants ( Bollenrath et al . , 1967a ) . In addition , the effective
...
The measured strains which correspond to one particular crystallographic
direction cannot be accurately related to stress by mechanically measured values
of the bulk elastic constants ( Bollenrath et al . , 1967a ) . In addition , the effective
...
Page 11
... less accurate and less precise . As seen from Eqs . ( 8 ) and ( 11 ) the residual
stress is related to the peak shift A0 by a stress constant . A plot of the stress
constant for iron as a function of 0 in the back - reflection range 750 - 88° is given
in ...
... less accurate and less precise . As seen from Eqs . ( 8 ) and ( 11 ) the residual
stress is related to the peak shift A0 by a stress constant . A plot of the stress
constant for iron as a function of 0 in the back - reflection range 750 - 88° is given
in ...
Page 36
in which bulk elastic constants are valid . These bulk elastic constants are usually
measured by mechanical methods . Unfortunately , polycrystalline materials are
usually not elastically isotropic and the selective nature of X - ray diffraction ...
in which bulk elastic constants are valid . These bulk elastic constants are usually
measured by mechanical methods . Unfortunately , polycrystalline materials are
usually not elastically isotropic and the selective nature of X - ray diffraction ...
What people are saying - Write a review
We haven't found any reviews in the usual places.
Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
Other editions - View all
Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |