Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 85
The solid curve of Fig . 9 is a schematic drawing illustrating such a pileup when
the broadening function becomes zero . The endpoints are 8 functions with
appropriate integral values . The solid curve neglects sample absorption , while
the ...
The solid curve of Fig . 9 is a schematic drawing illustrating such a pileup when
the broadening function becomes zero . The endpoints are 8 functions with
appropriate integral values . The solid curve neglects sample absorption , while
the ...
Page 87
A factor of 3X was used in the calculations to allow for a small amount of
additional broadening . VII . Analysis of Rocking Curve Data One can obtain the
subgrain size parallel to the surface ( L im ) for each composition from two orders
of the ...
A factor of 3X was used in the calculations to allow for a small amount of
additional broadening . VII . Analysis of Rocking Curve Data One can obtain the
subgrain size parallel to the surface ( L im ) for each composition from two orders
of the ...
Page 91
... INTENSITY 21 0 20 40 60 80 100 ATOM % NICKEL Fig . 14 . Three computer
simulations of intensity bands with diffusion coefficients scaled to within + 10 % of
the central curve ( solid lines ) . The broken curve represents the 75 min data .
... INTENSITY 21 0 20 40 60 80 100 ATOM % NICKEL Fig . 14 . Three computer
simulations of intensity bands with diffusion coefficients scaled to within + 10 % of
the central curve ( solid lines ) . The broken curve represents the 75 min data .
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Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
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Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |