## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Page 17

Note that since the angle between the incident and scattered beams is

the Soller slits , all these positions yield the same 20 . it ) , the x rays form a highly

collimated parallel beam . The angle of diffraction is uniquely

Note that since the angle between the incident and scattered beams is

**defined**bythe Soller slits , all these positions yield the same 20 . it ) , the x rays form a highly

collimated parallel beam . The angle of diffraction is uniquely

**defined**by the ...Page 21

The midpoint between the two detectors is

method assumes the diffraction profile is symmetric and that detector efficiencies

are matched . Reproducibility is about £20 MPa in a 3 min measurement on ...

The midpoint between the two detectors is

**defined**as the peak location . Themethod assumes the diffraction profile is symmetric and that detector efficiencies

are matched . Reproducibility is about £20 MPa in a 3 min measurement on ...

Page 72

If the normal to the sample surface is tilted by x relative to the plane

the incident and diffracted beams , the absorption factor contains a cos x term that

allows for the additional path length through the sample ( see Fig . 5 ) exp ( - 2 ( u

...

If the normal to the sample surface is tilted by x relative to the plane

**defined**bythe incident and diffracted beams , the absorption factor contains a cos x term that

allows for the additional path length through the sample ( see Fig . 5 ) exp ( - 2 ( u

...

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### Contents

R JAMES | 2 |

Principles of XRay Stress Measurement | 4 |

Control of Accuracy and Precision | 25 |

Copyright | |

15 other sections not shown

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### Common terms and phrases

absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray