## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

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Page 10

Standard Specimen u B ; m2 B Specimen surface 5x di d2 Fig . 3. Angles in

single exposure method . The angles ni and m2

...

Standard Specimen u B ; m2 B Specimen surface 5x di d2 Fig . 3. Angles in

single exposure method . The angles ni and m2

**define**the peak shift . The term ß**defines**the angle between the surface normal and the primary beam . TT angle in...

Page 17

Note that since the angle between the incident and scattered beams is

the Soller slits , all these positions yield the same 20 . it ) , the x rays form a highly

collimated parallel beam . The angle of diffraction is uniquely

Note that since the angle between the incident and scattered beams is

**defined**bythe Soller slits , all these positions yield the same 20 . it ) , the x rays form a highly

collimated parallel beam . The angle of diffraction is uniquely

**defined**by the ...Page 21

The midpoint between the two detectors is

method assumes the diffraction profile is symmetric and that detector efficiencies

are matched . Reproducibility is about +20 MPa in a 3 min measurement on ...

The midpoint between the two detectors is

**defined**as the peak location . Themethod assumes the diffraction profile is symmetric and that detector efficiencies

are matched . Reproducibility is about +20 MPa in a 3 min measurement on ...

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray