Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 47
Figure 17 shows that increasing shot size increases the depth of the compressive
zone , while Fig . 18 reveals that increased hardness of the base alloy results in a
higher peak stress . Such variables and others have been studied extensively ...
Figure 17 shows that increasing shot size increases the depth of the compressive
zone , while Fig . 18 reveals that increased hardness of the base alloy results in a
higher peak stress . Such variables and others have been studied extensively ...
Page 133
The majority of x rays come from a depth of 10 - 15 um so that it may be seen that
the nitride layer thickness reaches about 15 um after an immersion of 5 - 10 min .
It is possible to measure the nitride layer thickness layer accurately up to ...
The majority of x rays come from a depth of 10 - 15 um so that it may be seen that
the nitride layer thickness reaches about 15 um after an immersion of 5 - 10 min .
It is possible to measure the nitride layer thickness layer accurately up to ...
Page 174
High energy electrons also have an effective excitation depth ( Murata et al . ,
1971 ) , which in practice cannot easily be reduced to just a few tenths of a
micrometer as , e . g . , for optical excitation in GaAs ( see above ) . A spatial
depth ...
High energy electrons also have an effective excitation depth ( Murata et al . ,
1971 ) , which in practice cannot easily be reduced to just a few tenths of a
micrometer as , e . g . , for optical excitation in GaAs ( see above ) . A spatial
depth ...
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Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
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Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |