Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 108
In Section II the general principles of Mossbauer spectroscopy are presented,
and in Section III the main types of equipment used are discussed. The best way
to indicate what the Mossbauer technique is capable of is to outline those ...
In Section II the general principles of Mossbauer spectroscopy are presented,
and in Section III the main types of equipment used are discussed. The best way
to indicate what the Mossbauer technique is capable of is to outline those ...
Page 240
The fourth method used the observation that the deposit composition can be
changed with substrate bias as discussed in Section III , C , 1 , a . For laminates ,
the bias was alternately switched on and off during deposition . The fifth method ...
The fourth method used the observation that the deposit composition can be
changed with substrate bias as discussed in Section III , C , 1 , a . For laminates ,
the bias was alternately switched on and off during deposition . The fifth method ...
Page 244
Before discussion of the dc sputtering behavior of such particles , however , it is
important to review the sputtering ... Materials work on some of the oxide -
bearing deposits will be discussed along with work on other deposits in Section
IV . IV .
Before discussion of the dc sputtering behavior of such particles , however , it is
important to review the sputtering ... Materials work on some of the oxide -
bearing deposits will be discussed along with work on other deposits in Section
IV . IV .
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Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
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Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |