Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
From inside the book
Results 1-3 of 24
Page 6
In this equation , de , de is the lattice spacing in the direction defined by w and y (
see Fig . ... ( 2a ) Also ucu = 0 - ( 0 , + 0 ) = destino - do ( 2b ) do Substitution of
these equations into Eq . ( 1 ) yields : 1 + v room Vo sin do , - d0 , = d . , – d « , = 0
...
In this equation , de , de is the lattice spacing in the direction defined by w and y (
see Fig . ... ( 2a ) Also ucu = 0 - ( 0 , + 0 ) = destino - do ( 2b ) do Substitution of
these equations into Eq . ( 1 ) yields : 1 + v room Vo sin do , - d0 , = d . , – d « , = 0
...
Page 68
Solutions to the diffusion equation allow diffusion coefficients to be determined
from composition maps and this is probably a ... Diffraction Equations Consider
an X - ray beam of cross - sectional area A , making an angle of incidence 0 with
an ...
Solutions to the diffusion equation allow diffusion coefficients to be determined
from composition maps and this is probably a ... Diffraction Equations Consider
an X - ray beam of cross - sectional area A , making an angle of incidence 0 with
an ...
Page 236
Equations relating the initial and final velocities and energies of bombarding
particles have been derived previously ( e . g . , Symon , 1971 ) . The notion of
nonreflection of heavy sputtering gas atoms can be seen more readily , however ,
if it is ...
Equations relating the initial and final velocities and energies of bombarding
particles have been derived previously ( e . g . , Symon , 1971 ) . The notion of
nonreflection of heavy sputtering gas atoms can be seen more readily , however ,
if it is ...
What people are saying - Write a review
We haven't found any reviews in the usual places.
Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
Other editions - View all
Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray