Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 75
Specific examples of effective volume calculations are given in a later section . III
. Penetration Distance An initial consideration in applying X - ray diffraction to film
studies is the determination of optimum film thickness ; this can be obtained ...
Specific examples of effective volume calculations are given in a later section . III
. Penetration Distance An initial consideration in applying X - ray diffraction to film
studies is the determination of optimum film thickness ; this can be obtained ...
Page 92
... experimentally determined product ( u ( Ym ) ) Ym by an iterative procedure
already described using the pairs ( 333 ) - ( 444 ) , ( 222 ) - ( 444 ) , and ( 222 ) - (
333 ) . The composition profile for 45 min , as well as 2 and 5 hr , are given in Fig
.
... experimentally determined product ( u ( Ym ) ) Ym by an iterative procedure
already described using the pairs ( 333 ) - ( 444 ) , ( 222 ) - ( 444 ) , and ( 222 ) - (
333 ) . The composition profile for 45 min , as well as 2 and 5 hr , are given in Fig
.
Page 113
It is clearly possible for all three hyperfine interactions in a given material to be
nonzero and this gives rise to the enormous diversity of Mössbauer spectra .
Thus Mössbauer spectroscopy may be used as a fingerprint technique to identify
...
It is clearly possible for all three hyperfine interactions in a given material to be
nonzero and this gives rise to the enormous diversity of Mössbauer spectra .
Thus Mössbauer spectroscopy may be used as a fingerprint technique to identify
...
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Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
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absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray