## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Results 1-3 of 55

Page 45

It is then

The Marion - Cohen method appears to be a practical procedure for separating

the macrostress and the range of d spacings present due to microstresses ...

It is then

**important**to use at least six y tilts in a measurement at both + 4 , and - 4 .The Marion - Cohen method appears to be a practical procedure for separating

the macrostress and the range of d spacings present due to microstresses ...

Page 103

An area fraction modified by absorption is of

various effective volumes and therefore the ... Preliminary calculations like those

given in Tables I and II are

An area fraction modified by absorption is of

**importance**for determining thevarious effective volumes and therefore the ... Preliminary calculations like those

given in Tables I and II are

**important**to assess the feasibility of x - ray diffraction ...Page 104

These are known to have an

diffusion coefficient ( Balluffi and Blakely ... low temperatures where high

diffusivity paths are very

treated ...

These are known to have an

**important**, if not a dominant , effect on the volumediffusion coefficient ( Balluffi and Blakely ... low temperatures where high

diffusivity paths are very

**important**; however , these complications have not beentreated ...

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### Contents

R JAMES | 2 |

Principles of XRay Stress Measurement | 4 |

Control of Accuracy and Precision | 25 |

Copyright | |

15 other sections not shown

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### Common terms and phrases

absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray