Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 51
In a study of induction hardening , Ishii et al . ( 1969 ) found that tensile stresses
at the boundary of the hardened zone are more likely if the layer is thin ; also , the
stresses are greater after progressive quenching than after static quenching .
In a study of induction hardening , Ishii et al . ( 1969 ) found that tensile stresses
at the boundary of the hardened zone are more likely if the layer is thin ; also , the
stresses are greater after progressive quenching than after static quenching .
Page 133
For longer immersions both the nitrogen - austenite and ferrite contributions are
greatly reduced due to the nitride layer becoming thicker ( Fig . 14 ) . The majority
of x rays come from a depth of 10 - 15 um so that it may be seen that the nitride ...
For longer immersions both the nitrogen - austenite and ferrite contributions are
greatly reduced due to the nitride layer becoming thicker ( Fig . 14 ) . The majority
of x rays come from a depth of 10 - 15 um so that it may be seen that the nitride ...
Page 170
1 um for all layers , and the relative accuracy in the determination of x is better
than Ax = 0 . 005 from the ... The value of x , as well as gradients in composition
within a particular layer , are detected with adequate resolution . For evaluation of
...
1 um for all layers , and the relative accuracy in the determination of x is better
than Ax = 0 . 005 from the ... The value of x , as well as gradients in composition
within a particular layer , are detected with adequate resolution . For evaluation of
...
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Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
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Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |