Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
From inside the book
Results 1-3 of 27
Page 78
Normally there is a sufficient change in lattice parameter to give broad intensity
bands ( see Fig . 1 ) . Also , a stepped approximation to the composition has been
used because it is simpler than a linear element model ( see Figs . 3c and a ) .
Normally there is a sufficient change in lattice parameter to give broad intensity
bands ( see Fig . 1 ) . Also , a stepped approximation to the composition has been
used because it is simpler than a linear element model ( see Figs . 3c and a ) .
Page 83
8 m + Bỉm . ( 27 ) L 3m is the subgrain size perpendicular to the reflecting planes ,
and Bom is the instrumental variance parameter obtained from standards . In
applying Eq . ( 27 ) , the last term ( Bom ) should be smaller than the first
containing ...
8 m + Bỉm . ( 27 ) L 3m is the subgrain size perpendicular to the reflecting planes ,
and Bom is the instrumental variance parameter obtained from standards . In
applying Eq . ( 27 ) , the last term ( Bom ) should be smaller than the first
containing ...
Page 246
Lattice parameter measurements ( Fig . 12 ) showed that Al2O3 additions
decreased the lattice spacing whereas the spacing increased for ThO , additions .
The 2 vol . % ThO , alloy also had 0 . 27 wt . % Y and 0 . 5 wt % Ta ; this may have
...
Lattice parameter measurements ( Fig . 12 ) showed that Al2O3 additions
decreased the lattice spacing whereas the spacing increased for ThO , additions .
The 2 vol . % ThO , alloy also had 0 . 27 wt . % Y and 0 . 5 wt % Ta ; this may have
...
What people are saying - Write a review
We haven't found any reviews in the usual places.
Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
Other editions - View all
Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |