Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |
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Page 11
In the case of the “ single - exposure ” method , curves are plotted for typical
values of ß = 35o and 45° , while for the " two - tilt ” method , the curves are for the
typical y angles of 45° and 60° . An inspection of these curves shows that while
the ...
In the case of the “ single - exposure ” method , curves are plotted for typical
values of ß = 35o and 45° , while for the " two - tilt ” method , the curves are for the
typical y angles of 45° and 60° . An inspection of these curves shows that while
the ...
Page 66
This was overcome in later works with samples containing single crystal
substrates . Figure 1 qualitatively illustrates the formation of a continuous range
of alloys with a decreasing range of compositions as the diffusion time is
increased .
This was overcome in later works with samples containing single crystal
substrates . Figure 1 qualitatively illustrates the formation of a continuous range
of alloys with a decreasing range of compositions as the diffusion time is
increased .
Page 100
The xray sample was prepared with acid cut and polished single crystal
substrates , while the probe sample was prepared from a single crystal of Cu cut
with an abrasive wheel . An increase in density of high diffusivity paths is
expected in the ...
The xray sample was prepared with acid cut and polished single crystal
substrates , while the probe sample was prepared from a single crystal of Cu cut
with an abrasive wheel . An increase in density of high diffusivity paths is
expected in the ...
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Contents
R JAMES | 2 |
Principles of XRay Stress Measurement | 4 |
Control of Accuracy and Precision | 25 |
Copyright | |
15 other sections not shown
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Common terms and phrases
absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 Part 2 of Experimental Methods, Herbert Herman Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Edition | illustrated |
| Publisher | Academic Press, 1972 |
| Original from | the University of California |
| Digitized | 11 Mar 2011 |
| ISBN | 0123418194, 9780123418197 |
| Length | 256 pages |
| Export Citation | BiBTeX EndNote RefMan |