## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

Results 1-3 of 27

Page 6

where E is Young's modulus and v Poisson's ratio.f In this equation , deve is the

lattice

interplanar

surface at ...

where E is Young's modulus and v Poisson's ratio.f In this equation , deve is the

lattice

**spacing**in the direction defined by y and \ ( see Fig . 1 ) and d , theinterplanar

**spacing**of the stress - free state . The component of stress in thesurface at ...

Page 68

Let a function Hm ( Y ) represent the fraction of the sampling plane of crystalline

material with composition m diffracting with an average interplanar

The diffraction angle Om is given by Bragg's Law . For one - dimensional volume

...

Let a function Hm ( Y ) represent the fraction of the sampling plane of crystalline

material with composition m diffracting with an average interplanar

**spacing**dm .The diffraction angle Om is given by Bragg's Law . For one - dimensional volume

...

Page 69

A second considers a system of connecting elements with a linear

increase ( see Figs . 3a and c ) . If nonuniform strain is insignificant , small

subgrains of approximately uniform composition would give broadening due to

only particle ...

A second considers a system of connecting elements with a linear

**spacing**increase ( see Figs . 3a and c ) . If nonuniform strain is insignificant , small

subgrains of approximately uniform composition would give broadening due to

only particle ...

### What people are saying - Write a review

We haven't found any reviews in the usual places.

### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

### Other editions - View all

### Common terms and phrases

absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray