## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Page 27

For alloys , these two

For alloys , these two

**terms**often become complex and are usually neglected . ... TABLE III CHANGE IN CORRECTION FACTORS FROM 154 ° TO 158 ° 20 FOR UNPOLARIZED FE AND CRK , RADIATION**Term**20 154 ° 20 158 ° Difference 1.053 3 1.807 8 ...Page 75

Diffusion zones four times larger than 012 may be readily examined with single crystal substrates . It is simple to show that 8112 = 0.173 ( 1 / ) ( 1 / ) ( 13 ) using Eq . ( 5 ) and Bragg's Law to eliminate the sin 0

Diffusion zones four times larger than 012 may be readily examined with single crystal substrates . It is simple to show that 8112 = 0.173 ( 1 / ) ( 1 / ) ( 13 ) using Eq . ( 5 ) and Bragg's Law to eliminate the sin 0

**term**.Page 78

It should be evident that the orientation

It should be evident that the orientation

**term**g must be unity or known from other measurements if the volume fraction is to be determined and that the application of the reflectivity**term**of Eq . ( 12 ) requires a nearly epitaxial ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

11 other sections not shown

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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray