## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

### From inside the book

Results 1-3 of 38

Page 27

For alloys , these two

However , with automated processing it is little effort to incorporate them . Over

the range of 154° - 158° 20 , where the most commonly used diffraction line for ...

For alloys , these two

**terms**often become complex and are usually neglected .However , with automated processing it is little effort to incorporate them . Over

the range of 154° - 158° 20 , where the most commonly used diffraction line for ...

Page 75

... will be compared . Diffusion zones four times larger than 81 / 2 may be readily

examined with single crystal substrates . It is simple to show that 01 / 2 = 0 . 173 (

1 / 0 ) ( 1 / u ) ( 13 ) using Eq . ( 5 ) and Bragg ' s Law to eliminate the sin 8

... will be compared . Diffusion zones four times larger than 81 / 2 may be readily

examined with single crystal substrates . It is simple to show that 01 / 2 = 0 . 173 (

1 / 0 ) ( 1 / u ) ( 13 ) using Eq . ( 5 ) and Bragg ' s Law to eliminate the sin 8

**term**.Page 78

... integrated intensity data . It should be evident that the orientation

be unity or known from other measurements if the volume fraction is to be

determined and that the application of the reflectivity

nearly ...

... integrated intensity data . It should be evident that the orientation

**term**g mustbe unity or known from other measurements if the volume fraction is to be

determined and that the application of the reflectivity

**term**of Eq . ( 12 ) requires anearly ...

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### Contents

R JAMES | 2 |

Principles of XRay Stress Measurement | 4 |

Control of Accuracy and Precision | 25 |

Copyright | |

15 other sections not shown

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### Common terms and phrases

absorption additional allows alloy angle Appl applications atoms bandgap beam broadening cause coefficients components composition composition profile concentration constant containing cooling crystal curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distance distribution effect electron elements employed energy error et al example excitation experimental factor field function give given grain heat important included increasing intensity intensity bands iron laser lattice layer less magnetic material measurements Metals method Mössbauer observed obtained occur optical parameter peak phase Phys plane position possible powder problem produce range rays recent region relative residual stress sample semiconductors shift shown single Society solid spacing specimen spectra spectrum sputtering steel structure studies substrate surface target technique temperature term thickness values variation volume x-ray