Encyclopedia of Physical Science and Technology, Volume 19Robert A. Meyers The Encyclopedia of Physical Science and Technology contains in-depth presentations on all of today's critical technology areas, including: Materials synthesis and processing Electronic and photonic materials synthesis and processing Electronic and photonic materials Ceramics Composites High performance metals and alloys Flexible computer-integrated manufacturing Intelligent process equipment Micro- and nano-fabrication Software Microelectronics and opto-electronics High performance computing and networking High definition imaging and displays Sensors and signal processing Data storage and peripherals Computer simulation and modeling Aeronautics Surface transportation technologies Energy technologies Pollution remediation and waste management These technologies were specified as critical by a thirteen-member National Critical Technologies panel composed of government and private-sector members and chaired by chemist William D. Phillips. The Encyclopedia of Physical Science and Technology contains in-depth first-principle and applications descriptions of all the major emerging technologies in the physical sciences, inlcluding: Advanced materials Advanced semiconductor devices Artificial intelligence Digital imaging technology Flexible computer-integrated manufacturing High-density data storage High-performance computing Opto-electronics Sensor technology Superconductors The completely revised and updated Second Edition includes the following contributions: Thirty-one from the University of California that cover subjects ranging from nuclear energy, materials, mathematics, astronomy, and computers to anti-ballistic missile defense systems and laser applications Eighteen from the AT&T Bell Laboratories that cover communications disciplines, such as digital speech processing, telecommunications switching, and optical fibers Eleven from NASA that cover astronomy, atmospheric sciences, and space flight Nine from the University of Illinois that cover subjects ranging from manufacturing process technology and scientific information services to environmental data acquisition and very large scale integration (VLSI design) Eight from United States Navy Research Centers that cover x-ray lasers and telecommunications through non-linear optics and fluid dynamics Eight from the California Institute of Technology that cover astronomy, space sciences, and parallel computing Eight from the University of Colorado that cover subjects ranging from atomic physics ad geochemistry to telecommunications and the materials for microcircuitry Seven from the Electric Power Research Institute that cover power generation systems and air pollution Six from Cornell University that cover the solar system, bioprocess engineering, lasers, and dynamics Countries participating in the preparation of the Encyclopedia include: 76% United States institutions and 24% foreign institutions 12% with the European Economic Community (EEC)--7% of the contributors are from the United Kingdom, 3% are from Germany, and 1% are from Austria 1% Israel, France, and Japan 7% at institutions in Canada--the combination of the United States and Canada accounts for 83% of the contributions The author-institution community includes contributions from a total of eighteen countries--the United States, the United Kingdom, Canada, Germany, France, Israel, Japan, Austria, EEC institutions, Australia, Spain, the Netherlands, India, Korea, New Zealand, Sweden, Switzerland, and Italy The number of articles contributed by each country (excluding the United States) are: 49--the United Kingdom 46--Canada 22--Germany 9--France 7--Israel 7--Japan 5--Austria 2--EEC institutions 2--Australia 2--Spain 2--Netherlands 1--India 1--Korea 1--Norway 1--New Zealand 1--Sweden 1--Switzerland 1--Italy SUBJECT |
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Page 409
... wave would change the lengths of the interfer- ometer arms and one would measure the result- ing fringe shifts . Such detectors can , in princi- ple , record the entire waveform of an incoming wave rather than a single Fourier component ...
... wave would change the lengths of the interfer- ometer arms and one would measure the result- ing fringe shifts . Such detectors can , in princi- ple , record the entire waveform of an incoming wave rather than a single Fourier component ...
Page 430
... wave . Such a wave carries momentum as well as energy . The theory shows that the energy den- sity in the wave equals c times the momentum density , and this is verified by independent mea- surements of energy and momentum . For exam ...
... wave . Such a wave carries momentum as well as energy . The theory shows that the energy den- sity in the wave equals c times the momentum density , and this is verified by independent mea- surements of energy and momentum . For exam ...
Page 478
... waves of different amplitudes Eo , wavelengths X , and phases . Each of these waves may be represented by the so - called plane - wave solution of Maxwell's equations , E = Eo cos ( wt - Bz + ) = ( 1 ) where @ = 2πf and B 2π / λ . In ...
... waves of different amplitudes Eo , wavelengths X , and phases . Each of these waves may be represented by the so - called plane - wave solution of Maxwell's equations , E = Eo cos ( wt - Bz + ) = ( 1 ) where @ = 2πf and B 2π / λ . In ...
Contents
Guide to Using the Encyclopedia ix Raman Spectroscopy | 287 |
Random Vibrations | 305 |
Radiation Effects in Electronic Rare Earth Elements | 313 |
Copyright | |
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absorption analysis angle antenna applications atmosphere atomic calculated chemical components curve decay density detector determined device distribution dose duct effects electric electrons elements emission emitted energy equation ergy example failure field flux frequency function increase interaction ionization Krishnaiah latex light mass material matrix measure ment method neutron normal nuclear object observed operation optical parameters particles path loss photon physical plane planetary radio problem properties radar radiation radio radioactive radioactive wastes radionuclides rail Raman Raman scattering Raman spectroscopy range rare earth rare earth elements ray tracing reaction reactor relative reliability rest mass result robot rock rubber sample scattering sensor signal solid space special relativity spectral spectrum speed statistical stress structure surface target techniques temperature thermal tion track trons unit usually variables vector velocity waste wave wavelength