Treatise on Materials Science and TechnologyHerbert Herman |
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Page 137
... increased further if the experiment is set up in backscattering and the k- resolution element is increased ( Fig . 6c ) . An experimental setup realizing momentum space conditions as in Fig . 6c can be considered as a focusing design in ...
... increased further if the experiment is set up in backscattering and the k- resolution element is increased ( Fig . 6c ) . An experimental setup realizing momentum space conditions as in Fig . 6c can be considered as a focusing design in ...
Page 155
... increasing resolution elements . The information rate can be increased by addition of further analyzers . Because k 。 and Ak 。 mostly cannot be optimized for all analyzers and further not all analyzers have equal effectivity the ...
... increasing resolution elements . The information rate can be increased by addition of further analyzers . Because k 。 and Ak 。 mostly cannot be optimized for all analyzers and further not all analyzers have equal effectivity the ...
Page 281
... increasing technical applications , but the usefulness of YIG knew no bounds . Professor J. H. Van Vleck likened the ... increasingly . Principally owing to the magnetic properties of YIG and the optical properties of YAG , technical ...
... increasing technical applications , but the usefulness of YIG knew no bounds . Professor J. H. Van Vleck likened the ... increasingly . Principally owing to the magnetic properties of YIG and the optical properties of YAG , technical ...
Contents
Epitaxial Interfaces | 3 |
Thin Films | 15 |
Semiinfinite Overgrowths | 37 |
Copyright | |
11 other sections not shown
Common terms and phrases
a-site alloy Amer anisotropy Appl approximation atoms average axis B₁ Bragg Bragg reflections c-sites calculated cations coefficients coherent compounds concentration configuration constant Cooper pairs curve Debye-Waller factor defect density dependence discussed displacement elastic electron energy epitaxial equation experimental factor ferrimagnetic field film flux lines function garnet garnet structure GdIG Geller IAEA impurity Inelastic Scattering interaction interface iron garnets k₁ lattice constant lattice parameter Lett magnetic magnetocrystalline anisotropy measured Merwe method misfit misfit dislocations mode neutron scattering normal obtained overgrowth phase phonon Phys plane potential Proc properties rare earth rare earth ions reciprocal lattice resolution sample scattering cross section shown in Fig single crystal small angle solid strain stress sublattice substrate superconducting surface symmetry Table temperature tetrahedral thermal thickness transition metal values vector X-ray YGaG