## Treatise on Materials Science and Technology, Volume 2 |

### From inside the book

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Page 39

5 ) where d , which is usually assumed to be equal to c , is the distance between

the two atomic

thus assumed to be one of these , the specific one depending on which crystal is

...

5 ) where d , which is usually assumed to be equal to c , is the distance between

the two atomic

**planes**on either side of the ... Mathematically the**plane**z = 0 isthus assumed to be one of these , the specific one depending on which crystal is

...

Page 76

( a ) Vertical lines represent atomic

owing to constant ... 29 ( b ) , where p is the radius of curvature of the bent crystal

and z is measured from the lower

( a ) Vertical lines represent atomic

**planes**in normal crystal . ( b ) Bent crystalowing to constant ... 29 ( b ) , where p is the radius of curvature of the bent crystal

and z is measured from the lower

**plane**. If this crystal is straightened as in Fig .Page 137

In practice the scattering

symmetry

K , ) and therefore Ŝ ( k ) is an extremum with respect to , . This means § changes

...

In practice the scattering

**plane**, i . e . , the**plane**containing ko and kį , is often asymmetry

**plane**of the crystal investigated . In such cases Ŝ ( K , ) is equal to Ŝ ( -K , ) and therefore Ŝ ( k ) is an extremum with respect to , . This means § changes

...

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### Contents

Epitaxial Interfaces | 3 |

Thin Films | 15 |

Semiinfinite Overgrowths | 52 |

Copyright | |

10 other sections not shown

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### Common terms and phrases

angle anisotropy approximation assumed atoms average axis c-site calculated cations coherent compounds concentration condition considerations constants contribution corresponding crystal curve decreases defect density dependence determined diffusion direction discussed dislocations displacement effect elastic elastic scattering electron energy equation et al experimental experiments factor field flux flux lines follows force function garnets given gives important impurity increases interaction interface ions lattice limit magnetic materials measured Merwe metal method misfit mode neutron normal observed obtained optical parameter phase phonon Phys plane position potential present processes properties range reference region resolution respectively sample scattering cross section shown shows single solid solution space strain stress structure substrate superconducting surface Table temperature tetrahedral theory thermal thickness transition unit values vector wave X-ray