## Treatise on Materials Science and Technology, Volume 2 |

### From inside the book

Results 1-3 of 52

Page 120

Substitution of Eq . ( 52 ) into Eq . ( 48 ) gives a

of two parts : the elastic

vo ...

Substitution of Eq . ( 52 ) into Eq . ( 48 ) gives a

**scattering cross section**consistingof two parts : the elastic

**scattering cross section**with $ ( w ) and the inelastic**scattering cross section**. For the elastic**scattering cross section**, we obtain vo dovo ...

Page 125

In many cases , sufficient experimental data are available to take ph , j into

account in defect scattering . A comment is necessary concerning integrated one

- phonon

for a ...

In many cases , sufficient experimental data are available to take ph , j into

account in defect scattering . A comment is necessary concerning integrated one

- phonon

**scattering cross sections**. For X - rays , the contribution of one branchfor a ...

Page 172

The wavelength dependence of the defect induced change in total cross section

and the angular dependence of the

an indication for defect clusters ( BeO ) , for amorphous zones ( SiO2 ) , and for ...

The wavelength dependence of the defect induced change in total cross section

and the angular dependence of the

**scattering cross section**have been used asan indication for defect clusters ( BeO ) , for amorphous zones ( SiO2 ) , and for ...

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### Contents

Epitaxial Interfaces | 3 |

Thin Films | 15 |

Semiinfinite Overgrowths | 37 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

angle anisotropy approximation assumed atoms average axis c-sites calculated cations coherent concentration condition considerations constant contribution corresponding crystal curve defect density dependence determined diffusion direction discussed dislocations displacement effect elastic elastic scattering electron energy equation et al exist experimental experiments factor field flux lines follows force function garnet given gives important increasing Inelastic Scattering interaction interface ions lattice length limit magnetic materials measured Merwe metal method misfit mode neutron normal obtained parameter phase phonon Phys plane position potential present properties range rare earth reasonable reference region relation resolution respectively sample scattering cross section shown shows single solid solution space strain stress structure substrate superconducting surface Table temperature tetrahedral theory thermal thickness transition unit values vector X-ray