Treatise on Materials Science and Technology, Volume 2 |
From inside the book
Results 1-3 of 24
Page 17
Here , Ty is the tensile “ stress ' in the x direction and Tx , the shear " stress ” in
the film plane . An expression for T , may similarly be written down . The letters u
and o represent respectively the shear modulus and Poisson ' s ratio of the film ...
Here , Ty is the tensile “ stress ' in the x direction and Tx , the shear " stress ” in
the film plane . An expression for T , may similarly be written down . The letters u
and o represent respectively the shear modulus and Poisson ' s ratio of the film ...
Page 266
This gives rise to a stress field as well as to a change in elastic moduli around a
flux line . Therefore , any flux line can interact para - and diaelastically with any
internal stress field . Calculations on these grounds were performed first for a ...
This gives rise to a stress field as well as to a change in elastic moduli around a
flux line . Therefore , any flux line can interact para - and diaelastically with any
internal stress field . Calculations on these grounds were performed first for a ...
Page 333
This provides an effective means of eliminating cracking by cation substitutions .
There is another cause of stress , namely , the concentration or impurity effect .
The concentration effect causes stress through its effect on mismatches in a and
a .
This provides an effective means of eliminating cracking by cation substitutions .
There is another cause of stress , namely , the concentration or impurity effect .
The concentration effect causes stress through its effect on mismatches in a and
a .
What people are saying - Write a review
We haven't found any reviews in the usual places.
Contents
Epitaxial Interfaces | 3 |
Thin Films | 15 |
Semiinfinite Overgrowths | 52 |
Copyright | |
10 other sections not shown
Other editions - View all
Common terms and phrases
angle anisotropy approximation assumed atoms average axis c-site calculated cations coherent compounds concentration condition considerations constants contribution corresponding crystal curve decreases defect density dependence determined diffusion direction discussed dislocations displacement effect elastic elastic scattering electron energy equation et al experimental experiments factor field flux flux lines follows force function garnets given gives important impurity increases interaction interface ions lattice limit magnetic materials measured Merwe metal method misfit mode neutron normal observed obtained optical parameter phase phonon Phys plane position potential present processes properties range reference region resolution respectively sample scattering cross section shown shows single solid solution space strain stress structure substrate superconducting surface Table temperature tetrahedral theory thermal thickness transition unit values vector wave X-ray