## Treatise on Materials Science and Technology, Volume 2 |

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Page 17

Here , T , is the tensile “

film plane . An expression for T , may similarly be written down . The letters u and

o represent respectively the shear modulus and Poisson's ratio of the film and t ...

Here , T , is the tensile “

**stress**' in the x direction and Try the shear “**stress**” in thefilm plane . An expression for T , may similarly be written down . The letters u and

o represent respectively the shear modulus and Poisson's ratio of the film and t ...

Page 266

This gives rise to a

flux line . Therefore , any flux line can interact para- and diaelastically with any

internal

screw ...

This gives rise to a

**stress**field as well as to a change in elastic moduli around aflux line . Therefore , any flux line can interact para- and diaelastically with any

internal

**stress**field . Calculations on these grounds were performed first for ascrew ...

Page 333

This provides an effective means of eliminating cracking by cation substitutions .

There is another cause of

The concentration effect causes

a .

This provides an effective means of eliminating cracking by cation substitutions .

There is another cause of

**stress**, namely , the concentration or impurity effect .The concentration effect causes

**stress**through its effect on mismatches in a anda .

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### Contents

Epitaxial Interfaces | 3 |

Thin Films | 15 |

Semiinfinite Overgrowths | 37 |

Copyright | |

11 other sections not shown

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### Common terms and phrases

angle anisotropy approximation assumed atoms average axis c-sites calculated cations coherent concentration condition considerations constant contribution corresponding crystal curve defect density dependence determined diffusion direction discussed dislocations displacement effect elastic elastic scattering electron energy equation et al exist experimental experiments factor field flux lines follows force function garnet given gives important increasing Inelastic Scattering interaction interface ions lattice length limit magnetic materials measured Merwe metal method misfit mode neutron normal obtained parameter phase phonon Phys plane position potential present properties range rare earth reasonable reference region relation resolution respectively sample scattering cross section shown shows single solid solution space strain stress structure substrate superconducting surface Table temperature tetrahedral theory thermal thickness transition unit values vector X-ray