Treatise on Materials Science and TechnologyHerbert Herman |
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Page 17
... stress ' in the x direction and Tx , the shear " stress " in the film plane . An expression for T , may similarly be written down . The letters μ and σ represent respectively the shear modulus and Poisson's ratio of the film and t its ...
... stress ' in the x direction and Tx , the shear " stress " in the film plane . An expression for T , may similarly be written down . The letters μ and σ represent respectively the shear modulus and Poisson's ratio of the film and t its ...
Page 266
... stress field as well as to a change in elastic moduli around a flux line . Therefore , any flux line can interact para- and dia- elastically with any internal stress field . Calculations on these grounds were performed first for a screw ...
... stress field as well as to a change in elastic moduli around a flux line . Therefore , any flux line can interact para- and dia- elastically with any internal stress field . Calculations on these grounds were performed first for a screw ...
Page 333
... stress , namely , the concentration or impurity effect . The concentration effect causes stress through its effect on mismatches in a and a . As shown in previous sections on crystal and film growth , the nonuniform concentration , or ...
... stress , namely , the concentration or impurity effect . The concentration effect causes stress through its effect on mismatches in a and a . As shown in previous sections on crystal and film growth , the nonuniform concentration , or ...
Contents
Epitaxial Interfaces | 3 |
Thin Films | 15 |
Semiinfinite Overgrowths | 37 |
Copyright | |
13 other sections not shown
Common terms and phrases
a-site alloy Amer anisotropy Appl approximation atoms average axis B₁ Bragg Bragg reflections c-sites calculated cations coefficients coherent compounds concentration configuration constant Cooper pairs curve Debye-Waller factor defect density dependence discussed displacement elastic electron energy epitaxial equation experimental factor ferrimagnetic field film flux lines function garnet garnet structure GdIG Geller IAEA impurity Inelastic Scattering interaction interface iron garnets k₁ lattice constant lattice parameter Lett magnetic magnetocrystalline anisotropy measured Merwe method misfit misfit dislocations mode neutron scattering normal obtained overgrowth phase phonon Phys plane potential Proc properties R₁ rare earth rare earth ions reciprocal lattice resolution sample scattering cross section shown in Fig single crystal small angle solid strain stress sublattice substrate superconducting surface symmetry Table temperature thermal thickness transition metal values vector X-ray YGaG νμ ΦΩ