Treatise on Materials Science and Technology, Volume 2 |
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Page 122
65 ) coh , el Dyk ? where Cy ( Cv < 1 ) is the vacancy concentration , and random
distribution of vacancies is assumed . Diffusion broadens the elastic scattering
into a quasielastic line I do ( II . 66 ) d12 do ) quasiel , coh - w2 + Dy2k2 where Dy
...
65 ) coh , el Dyk ? where Cy ( Cv < 1 ) is the vacancy concentration , and random
distribution of vacancies is assumed . Diffusion broadens the elastic scattering
into a quasielastic line I do ( II . 66 ) d12 do ) quasiel , coh - w2 + Dy2k2 where Dy
...
Page 173
... electrical resistivity measurements gives the following most probable set of
defect properties : a specific resistivity of 400 u 2 / cm per percent Frenkel pair
concentration , a volume change A12 , of - 0 . 1 S2 , per vacancy and a volume
change ...
... electrical resistivity measurements gives the following most probable set of
defect properties : a specific resistivity of 400 u 2 / cm per percent Frenkel pair
concentration , a volume change A12 , of - 0 . 1 S2 , per vacancy and a volume
change ...
Page 222
Distribution of scattering intensity around ( 200 ) and ( 000 ) for the case of
Guinier - Preston zones of Cu in Al . microscopic studies that in this material the
interstitial loops have in the average larger size than vacancy loops . From this it
follows ...
Distribution of scattering intensity around ( 200 ) and ( 000 ) for the case of
Guinier - Preston zones of Cu in Al . microscopic studies that in this material the
interstitial loops have in the average larger size than vacancy loops . From this it
follows ...
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Contents
Epitaxial Interfaces | 3 |
Thin Films | 15 |
Semiinfinite Overgrowths | 52 |
Copyright | |
10 other sections not shown
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Common terms and phrases
angle anisotropy approximation assumed atoms average axis c-site calculated cations coherent compounds concentration condition considerations constants contribution corresponding crystal curve decreases defect density dependence determined diffusion direction discussed dislocations displacement effect elastic elastic scattering electron energy equation et al experimental experiments factor field flux flux lines follows force function garnets given gives important impurity increases interaction interface ions lattice limit magnetic materials measured Merwe metal method misfit mode neutron normal observed obtained optical parameter phase phonon Phys plane position potential present processes properties range reference region resolution respectively sample scattering cross section shown shows single solid solution space strain stress structure substrate superconducting surface Table temperature tetrahedral theory thermal thickness transition unit values vector wave X-ray
Bibliographic information
| Title | Treatise on Materials Science and Technology, Volume 2 Treatise on Materials Science and Technology, Herbert Herman |
| Editor | Herbert Herman |
| Publisher | Academic Press, 1972 |
| Original from | the University of Michigan |
| Digitized | 29 Nov 2007 |
| Export Citation | BiBTeX EndNote RefMan |