Treatise on Materials Science and Technology, Volume 2 |
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Page 115
Values for Oine in some explicit cases are given in BNL 325 ( Hughes and
Schwartz , 1958 ) . Otherwise they must be calculated as the difference O inc =
Obound - Ocoh , where o bound - values can be determined from free values
using O ...
Values for Oine in some explicit cases are given in BNL 325 ( Hughes and
Schwartz , 1958 ) . Otherwise they must be calculated as the difference O inc =
Obound - Ocoh , where o bound - values can be determined from free values
using O ...
Page 116
Therefore , in Table I some values of exp ( - 2W ) , obtained with Eqs . ( 33 ) and (
34 ) , are given for some representative materials , temperatures , and a values .
K values 8 Å - 1 and 4 Å - 1 are used because they define approximately the k ...
Therefore , in Table I some values of exp ( - 2W ) , obtained with Eqs . ( 33 ) and (
34 ) , are given for some representative materials , temperatures , and a values .
K values 8 Å - 1 and 4 Å - 1 are used because they define approximately the k ...
Page 361
The a values are useful technical quantities and are also excellent monitors of
the purity of samples . For example ... Si addition , the a value changes to 6 cm -
in the region between 5800 and 9100 cm - * ( LeCraw et al . , 1965 ) . The optical
...
The a values are useful technical quantities and are also excellent monitors of
the purity of samples . For example ... Si addition , the a value changes to 6 cm -
in the region between 5800 and 9100 cm - * ( LeCraw et al . , 1965 ) . The optical
...
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Contents
Epitaxial Interfaces | 3 |
Thin Films | 15 |
Semiinfinite Overgrowths | 52 |
Copyright | |
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angle anisotropy approximation assumed atoms average axis c-site calculated cations coherent compounds concentration condition considerations constants contribution corresponding crystal curve decreases defect density dependence determined diffusion direction discussed dislocations displacement effect elastic elastic scattering electron energy equation et al experimental experiments factor field flux flux lines follows force function garnets given gives important impurity increases interaction interface ions lattice limit magnetic materials measured Merwe metal method misfit mode neutron normal observed obtained optical parameter phase phonon Phys plane position potential present processes properties range reference region resolution respectively sample scattering cross section shown shows single solid solution space strain stress structure substrate superconducting surface Table temperature tetrahedral theory thermal thickness transition unit values vector wave X-ray