Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
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Page 105
... films with the neutron reflectometer , reference samples were prepared and analyzed . Two reference samples had either an LB film of H - CdA or a LB film of D - CdA . The specular reflection profiles of these two samples were not ...
... films with the neutron reflectometer , reference samples were prepared and analyzed . Two reference samples had either an LB film of H - CdA or a LB film of D - CdA . The specular reflection profiles of these two samples were not ...
Page 129
... films with diminishing film thickness below about 1200A [ 5 ] . Again , the increased concentrations were inferred by the resultant expansion of the host metal lattice parameter . It is of interest to determine where the hydrogen ...
... films with diminishing film thickness below about 1200A [ 5 ] . Again , the increased concentrations were inferred by the resultant expansion of the host metal lattice parameter . It is of interest to determine where the hydrogen ...
Page 134
... film is identical to that of the bulk , except that the ferromagnetic transition has a broader temperature ... film ( a ) [ DY 16lY9 ] ( b ) 80 60 T 40 T 4K 72K 80K 110K 20 130K 150K 0 2.0 2.2 2.4 2.0 2.2 2.4 Q2 ( Å ̄1 ) Fig . 1. The ...
... film is identical to that of the bulk , except that the ferromagnetic transition has a broader temperature ... film ( a ) [ DY 16lY9 ] ( b ) 80 60 T 40 T 4K 72K 80K 110K 20 130K 150K 0 2.0 2.2 2.4 2.0 2.2 2.4 Q2 ( Å ̄1 ) Fig . 1. The ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO