Low-dielectric Constant Materials-synthesis and Applications in Microelectronics: Symposium Held April 17-19, 1995, San Francisco, California, U.S.A.Toh-Ming Lu |
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Page 31
... ellipsometric measurements have been carried out . The DuPont fluorinated polyimide thin film was observed to be thermally stable up to 450 ° C , which is monitored by using dynamic TGA with a ramping rate of 10 ° C / min or 5 ° C / min ...
... ellipsometric measurements have been carried out . The DuPont fluorinated polyimide thin film was observed to be thermally stable up to 450 ° C , which is monitored by using dynamic TGA with a ramping rate of 10 ° C / min or 5 ° C / min ...
Page 32
... Ellipsometry and Opti - probe in SPDC in Texas Instruments . The FTIR is used to characterize the chemical changes in the fluorinated polyimide film before and after high temperature heat treatment . TGA is performed on Perkin Elmer ...
... Ellipsometry and Opti - probe in SPDC in Texas Instruments . The FTIR is used to characterize the chemical changes in the fluorinated polyimide film before and after high temperature heat treatment . TGA is performed on Perkin Elmer ...
Page 256
... ellipsometry in the wave length ranging from 0.3μm to 0.8μm . The results are shown in Table II . Since the refractive indices weakly depended on the wavelength , we only recorded in Table II their values at 0.632μm , which is typical ...
... ellipsometry in the wave length ranging from 0.3μm to 0.8μm . The results are shown in Table II . Since the refractive indices weakly depended on the wavelength , we only recorded in Table II their values at 0.632μm , which is typical ...
Contents
Methods | 3 |
Fluorinated Low Thermal Expansion Coefficient Polyimides | 19 |
Vapor Deposition of Very Low K Polymer Films | 45 |
Copyright | |
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1995 Materials Research absorption annealing applications bond BPDA-PDA bulk c-BN capacitance chemical vapor deposition circuit coating copolymer copper cured decrease density device dielectric film dielectric properties electrode electromigration FAST-SOG films film thickness films deposited fluorinated fluorinated polyimide frequency FTIR glass transition temperature h-BN helicon reactor IEEE Trans in-plane increase insulating integrated integrated circuits interlayer dielectric layer leakage current low dielectric constant lower Materials Research Society measured mechanical properties metal microelectronics Microwave modulus moisture monomers multilevel interconnections optical organic polymers oxide Parylene patterns PECVD permittivity planarization plasma plasma treatment polish rate polyimide polyimide film polymeric materials pore Proc refractive index resin resistance resonators RTCVD-SiOF sample shown in Figure Si-O-Si silica aerogels siloxane SiO2 SiO2 film slurry SOG film solvent spin-coated spin-on stress substrate surface Table technique Technology TEOS/O test structure thermal stability thin films ULSI vapor deposition wet etch