Low-dielectric Constant Materials-synthesis and Applications in Microelectronics: Symposium Held April 17-19, 1995, San Francisco, California, U.S.A.Toh-Ming Lu |
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Page 64
... observed under these conditions [ 16 , 19 ] . When the polymer coated substrate was immersed in water at 90oC for one hour prior to the tape pull test , we observed a significant loss of adhesion when the adhesion promoter was not used ...
... observed under these conditions [ 16 , 19 ] . When the polymer coated substrate was immersed in water at 90oC for one hour prior to the tape pull test , we observed a significant loss of adhesion when the adhesion promoter was not used ...
Page 148
... observed by Reiter was reproduced ; dewetting was observed for very thin films at elevated temperatures . In addition , a decrease in the polystyrene film thickness with increasing temperature was observed for the case of very thin ...
... observed by Reiter was reproduced ; dewetting was observed for very thin films at elevated temperatures . In addition , a decrease in the polystyrene film thickness with increasing temperature was observed for the case of very thin ...
Page 257
... observed around 930 cm1 and 3300 cm1 if any , are not observed in any SOGS . -1 -1 We derived the film stress by measuring the wafer curvature with the equation , σ = Eb2 / 6 ( 1 - v ) dR , where σ is the SOG film stress , E is Young's ...
... observed around 930 cm1 and 3300 cm1 if any , are not observed in any SOGS . -1 -1 We derived the film stress by measuring the wafer curvature with the equation , σ = Eb2 / 6 ( 1 - v ) dR , where σ is the SOG film stress , E is Young's ...
Contents
Methods | 3 |
Fluorinated Low Thermal Expansion Coefficient Polyimides | 19 |
Vapor Deposition of Very Low K Polymer Films | 45 |
Copyright | |
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1995 Materials Research absorption annealing applications bond BPDA-PDA bulk c-BN capacitance chemical vapor deposition circuit coating copolymer copper cured decrease density device dielectric film dielectric properties electrode electromigration FAST-SOG films film thickness films deposited fluorinated fluorinated polyimide frequency FTIR glass transition temperature h-BN helicon reactor IEEE Trans in-plane increase insulating integrated integrated circuits interlayer dielectric layer leakage current low dielectric constant lower Materials Research Society measured mechanical properties metal microelectronics Microwave modulus moisture monomers multilevel interconnections optical organic polymers oxide Parylene patterns PECVD permittivity planarization plasma plasma treatment polish rate polyimide polyimide film polymeric materials pore Proc refractive index resin resistance resonators RTCVD-SiOF sample shown in Figure Si-O-Si silica aerogels siloxane SiO2 SiO2 film slurry SOG film solvent spin-coated spin-on stress substrate surface Table technique Technology TEOS/O test structure thermal stability thin films ULSI vapor deposition wet etch