Low-dielectric Constant Materials-synthesis and Applications in Microelectronics: Symposium Held April 17-19, 1995, San Francisco, California, U.S.A.Toh-Ming Lu |
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Page ix
... pulse propagation in fine metal lines is inversely proportional to the square root of the dielectric constant of the insulating materials . The cross - talk between two adjacent lines , which dictates the minimum pitch chip - designers ...
... pulse propagation in fine metal lines is inversely proportional to the square root of the dielectric constant of the insulating materials . The cross - talk between two adjacent lines , which dictates the minimum pitch chip - designers ...
Page 157
... pulse impinging on sample is used to determine permittivity . The technique is attractive since it is relatively broadband and can be used for measurements of thin materials in the 10-100 GHz band . Measurements on dielectric thin ...
... pulse impinging on sample is used to determine permittivity . The technique is attractive since it is relatively broadband and can be used for measurements of thin materials in the 10-100 GHz band . Measurements on dielectric thin ...
Contents
Methods | 3 |
Low Dielectric Constant Thermosetting Resins | 111 |
Low Thermal Budget Processing of Organic Dielectrics | 117 |
Copyright | |
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1995 Materials Research absorption annealing applications bond BPDA-PDA bulk c-BN capacitance chemical vapor deposition circuit coating copolymer copper cured density device dielectric film dielectric properties electrode electromigration etch rate FAST-SOG films film thickness films deposited fluorinated fluorinated polyimide frequency FTIR g/cm³ glass transition temperature h-BN helicon reactor IEEE Trans in-plane increase insulating integrated integrated circuits interlayer dielectric layer leakage current low dielectric constant lower LPD-SiO2 Materials Research Society measured mechanical properties metal microelectronics Microwave modulus moisture monomers multilevel interconnections optical organic polymers oxide Parylene patterns PECVD permittivity planarization plasma plasma treatment polish rate polyimide polyimide film polymeric materials pore Proc refractive index resin resistance resonators RTCVD-SiOF sample shown in Figure Si-O-Si silica aerogels siloxane SiO2 SiO2 film slurry SOG film spin-coated spin-on stress substrate surface Table technique Technology TEOS/O thermal stability thin films ULSI vapor deposition wet etch