What people are saying - Write a review
We haven't found any reviews in the usual places.
Preparation and Property Correlations in Thin Films
Molecular Beam Epitaxy of Superlattices in Thin Films
Epitaxial Growth of Silicon StructuresThermal Laser
7 other sections not shown
Other editions - View all
activation energy alloy alloy films amorphous layer angle of misorientation annealing Appl Balluffi bulk Burgers vector calculated characterized composition concentration conduction band Cosandey crystal crystalline density device diffusional creep dopant doping effects elastic electromigration epitaxial growth epitaxial layer experimental film surface film thickness formation function GaAs Gossard grain boundary diffusion grain boundary structure growth rate implanted-amorphous impurities interdiffusion interface ion beam Ion Implantation kinetics laser lattice Lett low-angle materials Mayer measured mechanism microscopy monolayer multilayered Murakami observed occur optical oxide oxygen Pb film Pd2Si phase Philos phonon Phys plane Poate polycrystalline produced properties PtSi reaction refractory metal regrowth sample schematic Schottky barrier Schottky barrier height semiconductor shown in Fig shows silicide Silicide Contacts silicon single-crystal spectra sputtering strain relaxation stress studies substrate superconducting superlattice techniques thermal thin films tilt boundary Tsaur valence band values Wiegmann x-ray diffraction