Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
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... ISBN 0-444-00595-1 Volume 2 - Defects in Semiconductors , J. Narayan , T. Y. Tan , 1981 , ISBN 0-444-00596 - X Volume 3 - Nuclear and Electron Resonance Spectroscopies Applied to Materials Science , E. N. Kaufmann , G. K. Shenoy , 1981 ...
... ISBN 0-444-00595-1 Volume 2 - Defects in Semiconductors , J. Narayan , T. Y. Tan , 1981 , ISBN 0-444-00596 - X Volume 3 - Nuclear and Electron Resonance Spectroscopies Applied to Materials Science , E. N. Kaufmann , G. K. Shenoy , 1981 ...
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... ISBN 0-444-00869-1 Volume 28 - Rapidly Solidified Metastable Materials , B. H. Kear , B. C. Giessen , 1984 , ISBN 0-444-00935-3 Volume 29 - Laser - Controlled Chemical Processing of Surfaces , A. W. Johnson , D. J. Ehrlich , H. R. ...
... ISBN 0-444-00869-1 Volume 28 - Rapidly Solidified Metastable Materials , B. H. Kear , B. C. Giessen , 1984 , ISBN 0-444-00935-3 Volume 29 - Laser - Controlled Chemical Processing of Surfaces , A. W. Johnson , D. J. Ehrlich , H. R. ...
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... ISBN 0-931837-56-1 Volume 78 - Advances in Structural Ceramics , P. F. Becher , M. V. Swain , S. Sōmiya , 1987 , ISBN 0-931837-43 - X Volume 79 - Scattering , Deformation and Fracture in Polymers , G. D. Wignall , B. Crist , T. P. ...
... ISBN 0-931837-56-1 Volume 78 - Advances in Structural Ceramics , P. F. Becher , M. V. Swain , S. Sōmiya , 1987 , ISBN 0-931837-43 - X Volume 79 - Scattering , Deformation and Fracture in Polymers , G. D. Wignall , B. Crist , T. P. ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO