Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
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Page 55
... X - RAY SENSITIVE ORGANIC CRYSTALS A POSSIBLE · ALTERNATIVE TO X - RAY TOPOGRAPHY . M. DUDLEY Department of Materials Science and Engineering , State University of New York at Stony Brook , Stony Brook , New York 11794 , U.S.A. ABSTRACT ...
... X - RAY SENSITIVE ORGANIC CRYSTALS A POSSIBLE · ALTERNATIVE TO X - RAY TOPOGRAPHY . M. DUDLEY Department of Materials Science and Engineering , State University of New York at Stony Brook , Stony Brook , New York 11794 , U.S.A. ABSTRACT ...
Page 56
... X - ray sen- sitive , reactive organic crystals has been reported . Here we report the first systematic investigation of the feasibility of such applications of the technique . Two systems were primarily studied . Pyrene ( C16H10 ) ...
... X - ray sen- sitive , reactive organic crystals has been reported . Here we report the first systematic investigation of the feasibility of such applications of the technique . Two systems were primarily studied . Pyrene ( C16H10 ) ...
Page 59
... X - ray counterparts , so that based on strain sensitivity con- siderations neutron dislocation image widths can sometimes be expected to be narrower than the corresponding X - ray image widths . This is mainly due to the fact that the ...
... X - ray counterparts , so that based on strain sensitivity con- siderations neutron dislocation image widths can sometimes be expected to be narrower than the corresponding X - ray image widths . This is mainly due to the fact that the ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO