Neutron Scattering for Materials Science: Volume 166S. M. Shapiro, S. C. Moss, J. D. Jorgensen The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. |
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Page 41
... TECHNIQUE WIF DAVID , Rutherford Appleton Laboratory , Chilton , Didcot , Oxon , OX11 0QX , UK ABSTRACT Neutron powder diffraction is a powerful technique that provides a detailed description of moderately complex crystal structures ...
... TECHNIQUE WIF DAVID , Rutherford Appleton Laboratory , Chilton , Didcot , Oxon , OX11 0QX , UK ABSTRACT Neutron powder diffraction is a powerful technique that provides a detailed description of moderately complex crystal structures ...
Page 55
... technique can be a useful ally technique to the analogous X - ray techniques in studies of the influence of defects on reactivity in specimens of moderate X - ray sensitivity . In cases of extreme sensitivity , the neutron technique is ...
... technique can be a useful ally technique to the analogous X - ray techniques in studies of the influence of defects on reactivity in specimens of moderate X - ray sensitivity . In cases of extreme sensitivity , the neutron technique is ...
Page 323
... technique of neutron depth profiling ( NDP ) . The basics of the technique , typical applications , and descriptions of the NDP facilities within the U. S. have been described at two recent conferences and elsewhere in the literature ...
... technique of neutron depth profiling ( NDP ) . The basics of the technique , typical applications , and descriptions of the NDP facilities within the U. S. have been described at two recent conferences and elsewhere in the literature ...
Contents
THE KINDER GENTLER PROBE OF CONDENSED MATTER | 3 |
NEUTRON SCATTERING METHODS FOR MATERIAL SCIENCE | 15 |
THE ADVANCED NEUTRON SOURCE | 27 |
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1990 Materials Research aerogel alloys analysis angle neutron scattering annealing Argonne Argonne National Laboratory atoms beam boron Bragg Bragg peaks calculated composition concentration copolymer correlation Cu-O decrease defects detector determined deuterated deuterium diffractometer diffuse scattering displacements distribution effect elastic electronic energy experimental Fermi surface ferroelastic Figure film function incoherent scattering increase inelastic interactions interface ISBN lattice parameter layers Lett magnetic Materials Research Society Materials Science measured metals method mode molecular multilayers National Laboratory neutron diffraction neutron powder diffraction neutron reflectivity Neutron Source observed obtained oxygen oxygen content particles peak phase transition phonon Phys plane polymer pore powder diffraction Proc range reactor refinement residual stresses resolution sample scattering intensity short-range order shown in Fig shows silica silicon single crystal sintering specimen spectrometer stoichiometry strain structure factor superconductivity surface Symp technique temperature thermal values Volume Vycor wafer wavelength width X-ray YBCO