Current Trends in the Physics of Materials: S. Terenzo Di Lerici, Villa Marigola, 20 June-8 July 1988
The last ten years have witnessed considerable developments in new materials and in experimental techniques for their preparation, characterization and study. Various new fundamental phenomena have been discovered and new directions for applications have come to life - e.g. quantum wells and superlattices, high T- c superconductors, scanning tunnelling microscopy and the various techniques involving the use of sources of synchrotron radiation. This book reviews main areas of current interest in the study of the physical properties of materials, from basic concepts and analytical laboratory techniques to developments in technical applications and is directed to solid-state physicists and chemists, materials scientists and materials and device engineers.
78 pages matching editions:ISBN0444894268 in this book
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adatom alloys amorphous anisotropy annealing atoms band beam behaviour bonds brittle bulk Burgers vector calculations catalyst chemical chemisorption cleavage compounds configuration crack tip crystal curve density dependence diffraction diffusion dimer dislocation ductile effects electron elements embrittlement energy epitaxial equilibrium example experimental experiments ferromagnetic field fission formation fracture fuel function GaAs grain boundary growth heat impurities interaction interface ion implantation irradiation isotope lattice layer Lett magnetic measured mechanism metals metastable microstructure molecular dynamics neutron neutron scattering nuclear oxide oxygen parameters phase phonon photoemission Phys physical plane point defects potential properties pulsed quasi-crystals rare-earth reaction reactor saddle point sample scattering Schematic segregation semiconductors shown in fig shows silicon simulation solid spectra spectroscopy steel stress structure studies substrate superconducting surface synchrotron radiation techniques temperature theory thermal trajectories transition uranium dioxide vacancy valence values vector wavelength X-ray