Materials Science and Technology: A Comprehensive TreatmentEric Lifshin, Robert W. Cahn, Peter Haasen, Edward J. Kramer This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. From the Contents: DiNardo: Scanning Tunneling Microscopy. De Batist: Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons |
Contents
Nanoscale Characterization of Surfaces and Interfaces | 4 |
Contents | 6 |
11 | 12 |
Copyright | |
19 other sections not shown
Other editions - View all
Materials Science and Technology: A Comprehensive Treatment Robert Wolfgang Cahn,Peter Haasen,Edward J. Kramer No preview available - 1994 |
Common terms and phrases
acoustic adatoms alloy amplitude angle applications atom probe atomic number Auger Auger electron backscattered beam bias Binnig composition constant crystal curve damping density depth detected detector diffraction dislocation distribution effects electron elements energy enthalpy ergy Exner experimental field Figure film frequency function geometric grain boundaries graphite Hansma image analysis Instrum interaction interface Kushibiki lattice layer Lett linear magnetic materials mathematical morphology measured mechanical spectroscopy ment metal method microscope microstructural modulus neutron Nucl observed obtained oxygen parameters particles peak phase Phys piezoelectric planar proton pulse quantitative Rayleigh waves relaxation sample scanning scanning tunneling microscope scattering shown in Fig shows signal specimen spectra spectroscopy spectrum Stereology STM images stress structure substrate superconducting surface techniques Technol temperature thermal tion tron tunneling ture velocity voltage X-ray YBCO