Materials Science and Technology: A Comprehensive TreatmentEric Lifshin, Robert W. Cahn, Peter Haasen, Edward J. Kramer This is the second of two volumes focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. From the Contents: DiNardo: Scanning Tunneling Microscopy. De Batist: Mechanical Spectroscopy. Castle/Baker: Auger Electron Microscopy. Briggs: Quantitative Acoustic Microscopy. Exner: Quantitative Analysis of Microstructure. Lifshin: Electron Microprobe Analysis. Ma/Zhang/Chu/Liu: High Energy Ion Beam Analysis Techniques. Cerezo/Smith: Field Ion Microscopy and the Position Sensitive Atom Probe. Von Dreele: Neutron Diffraction. May/Williams/Guinier: Small-Angle Scattering of X-Rays and Neutrons |
Contents
Nanoscale Characterization of Surfaces and Interfaces | 4 |
Contents | 6 |
11 | 12 |
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Materials Science and Technology: A Comprehensive Treatment Robert Wolfgang Cahn,Peter Haasen,Edward J. Kramer No preview available - 1994 |
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adatoms alloy amplitude analysis angle atom probe Auger backscattering beam bias Binnig calculated composition constant curve damping density depth detected detector diffraction dislocation distribution effects elec electron elements energy enthalpy Exner experimental field evaporation field-ion Figure film frequency function geometry grain boundaries graphite Hansma Instrum intensity interaction interface lattice layer Lett magnetic materials measured mechanical spectroscopy ment metal method microscope microstructure modulus neutron diffraction neutron scattering Nucl observed obtained oxygen parameters particles peak phase Phys piezoelectric POSAP powder powder diffraction proton pulse Rayleigh waves region relaxation resolution resonance Rietveld refinement sample scanning scanning tunneling microscope shown in Fig shows single crystal spatial specimen spectra spectroscopy spectrum Stereology STM images stress structure substrate superconducting surface techniques Technol temperature thermal tion tron ture voltage wave wavelength X-ray YBCO